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Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
standard by ASTM International, 03/01/2018
ASTM F996-11(2018)
$48.00 Original price was: $48.00.$24.00Current price is: $24.00.