BS 9300:1969

$114.30

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BS 9300:1969

$114.30

Specification for semiconductor devices of assessed quality: generic data and methods of test
standard by BSI Group, 07/31/1969

Format: PDF      In Stock

 

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Description

Forms part of the system of standards for electronic components of assessed quality. Terms, definitions, test methods and other material necessary to implement fully the detail specifications for semiconductor devices. Included in section 2 are the general rules for preparation of detail specifications. Appendix C gives the agreed procedure for the adoption of specifications in the CV7000 series into the BS 9000 system. See also PD 6460.

Cross References:
BS 2011
BS 3363
BS 3934
BS 3939
BS 4000
BS 4727
BS 5295
BS 6001
BS 9000:Part 1
PD 6460
IEC 134

Replaces BS 3494:Part 1:1967 and BS 3494:Part 2:1966.

Replaced by BS CECC 50000:1987 but remains current due to existing approvals.

Incorporates the following:
AMD 2132 published 15 October 1976
AMD 2589 published 15 July 1978
AMD 3091 published 15 April 1980
AMD 3557 published 15 August 1981
AMD 3978 published 15 August 1982
AMD 4589 published 15 September 1984
AMD 670 published 15 December 1970
AMD 682 published 15 February 1971
AMD 7517 published 15 February 1993
AMD 855 published 15 February 1972

Product Details

Published:
07/31/1969
ISBN(s):
0580056813
Number of Pages:
584
File Size:
1 file , 5.1 MB
Product Code(s):
00148852, 00148852, 00148852